![FEI Scios DualBeam FIB SEM instrument](/sites/default/files/float-img/2023-08/scios_main_2.jpg)
Precision dualbeam FIB-SEM for 3D analyses and TEM lamella preparation.
Key Features:
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Ga+ ion beam system enables site-specific milling for sub-surface analysis or lamella preparation for TEM analyses
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Features elemental and crystallographic analysis via Oxford Aztec EDS and EBSD systems
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(coming soon) Located at University of Missouri’s Research Reactor (MURR) to facilitate handling of irradiated media
![example image from FEI Scios FIB-SEM](/sites/default/files/inline-images/scios_example-composite.png)