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Precision dualbeam FIB-SEM for 3D analyses and TEM lamella preparation.
Key Features:
- Ga+ ion beam system enables site-specific milling for sub-surface analysis or lamella preparation for TEM analyses.
- Features elemental and crystallographic analysis via Oxford Aztec EDS and EBSD systems.
- Located at University of Missouri’s Research Reactor (MURR) to facilitate handling of irradiated media.
Example image: Surface defects of a stainless steel revealed to be caused by chemical inhomogeneities in the sample interior as observed via imaging (left) and elemental mapping (right) post- FIB milling.