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Capable of atomic-resolution scanning TEM imaging and elemental mapping.
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3D tomography at nanometer resolution in both TEM and STEM modes.
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4D-STEM for mapping of strain, chemical phase, crystal orientation, electric polarization, and magnetic flux.
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High energy resolution electron energy loss spectroscopy (EELS) for phonon scattering & bandgap study.
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Cryo-TEM for beam sensitive specimens.
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In-situ TEM capabilities for studying real-time dynamic behaviors of materials subject to heating, electrical bias, and gas/liquid environments.
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Lorentz lens for magnetic domains and domain wall imaging.