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Phenom ProX Datasheet
Desktop SEM for rapid sample screening – fills the gap between light microscopy and floor-model SEM.
Key features
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Capable of BSE and SE imaging, as well as full EDS elemental identification and mapping
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Features integrated 3D roughness reconstruction software for quantitative topographical measurements
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Rapid sample exchange: SEM analysis within 60 seconds of loading
*Located in the Materials Characterization and Fabrication Facility (C3241 Lafferre Hall)
Example image: Carbon fibers coated with Co-based metal organic framework (MOF) as imaged (left) and following 3D roughness reconstruction (right).